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Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments

  • Hans-Rudolf Wenk (a1), Luca Lutterotti (a2), Pamela Kaercher (a1), Waruntorn Kanitpanyacharoen (a1), Lowell Miyagi (a3) and Roman Vasin (a1) (a4)...

Abstract

Synchrotron X-ray diffraction images are increasingly used to characterize crystallographic preferred orientation distributions (texture) of fine-grained polyphase materials. Diffraction images can be analyzed quantitatively with the Rietveld method as implemented in the software package Materials Analysis Using Diffraction. Here we describe the analysis procedure for diffraction images collected with high energy X-rays for a complex, multiphase shale, and for those collected in situ in diamond anvil cells at high pressure and anisotropic stress.

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Corresponding author

a) Author to whom correspondence should be addressed. Electronic mail: wenk@berkeley.edu

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Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments

  • Hans-Rudolf Wenk (a1), Luca Lutterotti (a2), Pamela Kaercher (a1), Waruntorn Kanitpanyacharoen (a1), Lowell Miyagi (a3) and Roman Vasin (a1) (a4)...

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