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New statistical calibration approach for Bruker AXS D8 Discover microdiffractometer with Hi-Star detector using GADDS software

  • Ralph Rowe (a1)

Abstract

An additional statistical calibration for the Bruker D8 Discover microdiffractometer is necessary to obtain accurate reproducible 2θ data for cell-refinement work. This new approach uses a graphical mapping method of the 2θ error versus the location of a selected diffraction peak on the detector surface to describe the separate roles of different calibration procedures (rebiasing, flood field, and spatial corrections) and parameters (sample-to-detector distance, x-y center coordinate) in minimizing the error. Optimized parameters are used to obtain the lowest achievable Δ2θ with this setup. Intensity error relative to the position of the diffracted line on the detector was found to be consistent at up to 20% and could not be reduced using any of the investigated techniques and parameters.

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Corresponding author

a)Electronic mail: rrowe@mus-nature.ca

References

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Bruker AXS, Inc. (2001). GADDS Service/Administrator’s Manual (Manual Kit 662-002400) (Madison, Wisconsin).
He, B. B., Preckwinkel, U., and Smith, K. L. (2000). “Fundamentals of two-dimensional X-ray diffraction (XRD2)” in Advances in X-ray Analysis (JCPDS, International Center for Diffraction Data, Swarthmore, PA), Vol. 43, pp. 273280.
ICDD (1960). Powder Diffraction File No. 10-0173, Natl. Bur. Stand (U.S.), Circ. No. 539 (U.S. GPO, Washington, D.C.), Vol. 9, p. 3.
Jones, R. and Young, R. (2007). “Monthly Calibration of the Hi-Star Detector” (Bruker AXS, Madison, WI), Part No. M88-E01118.
Smith, K. L. (2001). “Pole Figures Using an Area Detector, Revision 2.1” (Bruker AXS, Madison, WI).
Zoltai, T. and Stout, J. H. (1984). ”Mineralogy: Concepts and Principles” (Burgess, Minneapolis), p. 505.

Keywords

New statistical calibration approach for Bruker AXS D8 Discover microdiffractometer with Hi-Star detector using GADDS software

  • Ralph Rowe (a1)

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