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Materials characterization from diffraction intensity distribution in the γ-direction

Published online by Cambridge University Press:  15 April 2014

Bob B. He
Bob B. He*
Affiliation:
Bruker AXS Inc., Madison, Wisconsin
*
a)Author to whom correspondence should be addressed. Electronic mail: bob.he@bruker-axs.com
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Abstract

Two-dimensional X-ray diffraction (XRD2) pattern can be described by the diffraction intensity distribution in both 2θ and γ-directions. The XRD2 images can be reduced to two kinds of profiles: 2θ-profile and γ-profile. The 2θ-profile can be evaluated for phase identification, crystal structure refinement, and many applications with many existing algorithms and software. In order to evaluate the materials structure associated with the intensity distribution along γ-angle, either the XRD2 pattern should be directly analyzed or the γ-profile can be generated by 2θ-integration. A γ-profile contains information on texture, stress, crystal size, and crystal orientation relations. This paper introduces the concept and fundamental algorithms for stress, texture, and crystal size analysis by the γ-profile analysis.

Keywords

2D detectorstresstexturecrystal sizecrystal orientationdiffraction vector
Type
Technical Articles
Information
Powder Diffraction , Volume 29 , Issue 2 , June 2014 , pp. 113 - 117
Copyright
Copyright © International Centre for Diffraction Data 2014 

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References

Bunge, H. J. and Klein, H. (1996). “Determination of quantitative, high-resolution pole figures with the area detector”, Z. Metallkd. 87(6), 465–475.Google Scholar
He, B. B. (2009). Two-dimensional X-ray Diffraction (Wiley, New York).CrossRefGoogle Scholar
He, B. B. and Smith, K. L. (1998). “Computer simulation of diffraction stress measurement with 2d detectors,” in Proceedings of 1998 SEM Spring Conference on Experimental and Applied Mechanics, Houston, USA.Google Scholar
Noyan, I. C. and Cohen, J. B. (1987). Residual Stress (Spinger-Verlag, New York).CrossRefGoogle Scholar
Yu, L. (2011). Polymorphs and Glasses of Organic Molecules, presentation provided by Professor Lian Yu, School of Pharmacy & Department of Chemistry University of Wisconsin, Madison.Google Scholar