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Materials assurance through orthogonal materials measurements: X-ray fluorescence aspects

  • Mark A. Rodriguez (a1), Mark H. Van Benthem (a1), Donald F. Susan (a1), James J. M. Griego (a1), Pin Yang (a1), Curtis D. Mowry (a1) and David G. Enos (a1)...

Abstract

X-ray fluorescence (XRF) has been employed as one of several orthogonal means of screening materials to prevent counterfeit and adulterated products from entering the product stream. We document the use of principal component analysis (PCA) of XRF data on compositionally similar and dissimilar stainless steels for the purpose of testing the feasibility of employing XRF spectra to parse and bin these alloys as the same or significantly different alloy materials. The results indicate that XRF spectra can separate and assign alloys via PCA, but that important corrections for detector drift and scaling must be performed in order to achieve valid results.

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a) Author to whom correspondence should be addressed. Electronic mail: marodri@sandia.gov

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Materials assurance through orthogonal materials measurements: X-ray fluorescence aspects

  • Mark A. Rodriguez (a1), Mark H. Van Benthem (a1), Donald F. Susan (a1), James J. M. Griego (a1), Pin Yang (a1), Curtis D. Mowry (a1) and David G. Enos (a1)...

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