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JCPDS—International Centre for Diffraction Data statistical process control method development

Published online by Cambridge University Press:  10 January 2013

T. N. Blanton ,
W. N. Schreiner ,
J. N. Dann ,
G. P. Hamill  and
R. F. Hamilton
T. N. Blanton*
Affiliation:
Eastman Kodak Company
W. N. Schreiner
Affiliation:
IC Laboratories
J. N. Dann
Affiliation:
Osram Sylvania, Incorporated
G. P. Hamill
Affiliation:
Rigaku U.S.A., Incorporated
R. F. Hamilton
Affiliation:
Air Products and Chemicals Incorporated
*
a)Author to whom any correspondence should be addressed: Eastman Kodak Co., Kodak Park, B49, Rochester, NY 14652-3712.
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Abstract

A task group of the JCPDS—International Centre for Diffraction Data (ICDD) was established for the purpose of investigating a methodology which would be applicable for statistical process control monitoring of X-ray powder diffractometers. A procedure for collecting X-ray diffraction data for statistical process control purposes and the incorporation of these data into control charts are presented. The results of this task group show that, through the use of statistical process control methods, noncontrol situations for diffractometers were detected, the causes of these problems were identified, and these problems were corrected and noted on control charts.

Keywords

Shewhart control chartsstatistical process controlX-ray diffraction
Type
Research Article
Information
Powder Diffraction , Volume 8 , Issue 4 , December 1993 , pp. 229 - 235
Copyright
Copyright © Cambridge University Press 1993

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