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Full spectrum calculations of EDXRF spectra

Published online by Cambridge University Press:  01 March 2012

W. T. Elam ,
Bob Shen ,
Bruce Scruggs  and
Joseph Nicolosi
W. T. Elam
Affiliation:
EDAX, Inc., Mahwah, New Jersey 70430
Bob Shen
Affiliation:
EDAX, Inc., Mahwah, New Jersey 70430
Bruce Scruggs
Affiliation:
EDAX, Inc., Mahwah, New Jersey 70430
Joseph Nicolosi
Affiliation:
EDAX, Inc., Mahwah, New Jersey 70430
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Abstract

Rapid and accurate methods are becoming available to calculate all of the relevant physical effects that contribute to an energy-dispersive X-ray fluorescence (EDXRF) spectrum, rather than just the characteristic line intensities given by the traditional fundamental parameters method. To evaluate the utility of such methods, we have calculated the full spectra of several compounds covering a wide range of compositions. The calculated spectra are compared directly with measured spectra. They include scattering of the X-ray tube lines and continuum, the Compton profile, and the detector response. Our results indicate that it is now possible to compute the full spectrum from an EDXRF system with very good accuracy.

Type
X-Ray Fluorescence and Related Techniques
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 152 - 155
Copyright
Copyright © Cambridge University Press 2006

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