Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-25T01:01:58.532Z Has data issue: false hasContentIssue false
  • English
  • Français

F07 A New Approach for Quantitative Analysis in EDXRF Using Silicon Drift Detectors

Published online by Cambridge University Press:  20 May 2016

J. Heckel
J. Heckel
Affiliation:
SPECTRO A.I., Kleve, Germany
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 183
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)