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Direct preparation and microstructure investigation of p-type transparent conducting Ga-doped SnO2 thin films

  • Tieying Yang (a1), Xiubo Qin (a1), Huan-hua Wang (a1), Quanjie Jia (a1), Runsheng Yu (a1), Baoyi Wang (a1), Jiaou Wang (a1), Kurash Ibrahim (a1) and Xiaoming Jiang (a1)...

Abstract

Transparent p-type conducting Ga-doped SnO2 thin films were prepared using reactive rf-magnetron sputtering. Good p-type conduction was directly realized without the need of postdeposition annealing. The p-type conductivity was found to be very sensitive to the growth condition and process, suggesting that the carrier behavior is strongly related to the fine microstructure of the films. The microstructures of the films were characterized using synchrotron X-ray diffraction and specular reflectivity techniques. The valence state of the Ga dopant was measured from X-ray photoelectron spectra to explain the origin of net holes presented in the films.

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Corresponding author

a)Author to whom correspondence should be addressed. Electronic mail: yangty@ihep.ac.cn
b)Electronic mail: wanghh@ihep.ac.cn

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Keywords

Direct preparation and microstructure investigation of p-type transparent conducting Ga-doped SnO2 thin films

  • Tieying Yang (a1), Xiubo Qin (a1), Huan-hua Wang (a1), Quanjie Jia (a1), Runsheng Yu (a1), Baoyi Wang (a1), Jiaou Wang (a1), Kurash Ibrahim (a1) and Xiaoming Jiang (a1)...

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