Hostname: page-component-848d4c4894-2xdlg Total loading time: 0 Render date: 2024-06-26T23:38:11.512Z Has data issue: false hasContentIssue false
  • English
  • Français

D-61 Invited—Toward Nanometer Resolution for Strain Mapping in Single Crystals: New Focusing Optics and Dynamical Diffraction Artifacts

Published online by Cambridge University Press:  20 May 2016

H. Yan ,
H. C. Kang ,
J. Maser ,
A. T. Macrander ,
C. Liu ,
R. Conley ,
G. B. Stephenson ,
I. C. Noyan  and
O. Kalenci
H. Yan
Affiliation:
Argonne National Laboratory, Argonne, IL
H. C. Kang
Affiliation:
Argonne National Laboratory, Argonne, IL
J. Maser
Affiliation:
Argonne National Laboratory, Argonne, IL
A. T. Macrander
Affiliation:
Argonne National Laboratory, Argonne, IL
C. Liu
Affiliation:
Argonne National Laboratory, Argonne, IL
R. Conley
Affiliation:
Argonne National Laboratory, Argonne, IL
G. B. Stephenson
Affiliation:
Argonne National Laboratory, Argonne, IL
I. C. Noyan
Affiliation:
Columbia University, New York, NY
O. Kalenci
Affiliation:
Columbia University, New York, NY
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 180
Copyright
Copyright © Cambridge University Press 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)