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D-41 Residual Stress Analysis of Non-Polar GaN Epi-Layers By GIXRD

Published online by Cambridge University Press:  20 May 2016

Y.-i. Jang ,
K.-h. Park ,
S.-r. Cho  and
H.-k. Kwon
Y.-i. Jang
Affiliation:
LG Electronics Institute of Technology, Seoul, Korea
K.-h. Park
Affiliation:
LG Electronics Institute of Technology, Seoul, Korea
S.-r. Cho
Affiliation:
LG Innoteck, Seoul, Korea
H.-k. Kwon
Affiliation:
LG Innoteck, Seoul, Korea
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 175
Copyright
Copyright © Cambridge University Press 2008

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