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D041 High Resolution X-ray Diffraction Studies of Epitaxially Grown GaN/SiC(0001) - Growth Conditions, Defect Density and Stress

Published online by Cambridge University Press:  20 May 2016

N. Faleev ,
H. Temkin ,
I. Ahmad ,
M. Holtz  and
Yu. Melnik
N. Faleev
Affiliation:
Texas Tech University, Lubbock, TX
H. Temkin
Affiliation:
Texas Tech University, Lubbock, TX
I. Ahmad
Affiliation:
Texas Tech University, Lubbock, TX
M. Holtz
Affiliation:
Texas Tech University, Lubbock, TX
Yu. Melnik
Affiliation:
TDI, Inc., Gaithersburg, MD
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 173
Copyright
Copyright © Cambridge University Press 2003

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