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D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations

  • J. Keckes (a1), K. J. Martinschitz (a1) and E. Eiper (a1)

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D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations

  • J. Keckes (a1), K. J. Martinschitz (a1) and E. Eiper (a1)

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