Skip to main content Accessibility help
×
Home

Certification of Standard Reference Material 1976B

  • David R. Black (a1), Donald Windover (a1), Marcus H. Mendenhall (a1), Albert Henins (a1), James Filliben (a1) and James P. Cline (a1)...

Abstract

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation of this powder diffraction SRM. SRM 1976b consists of a sintered alumina disc, approximately 25.6 mm in diameter by 2.2 mm in thickness, intended for use in the calibration of X-ray powder diffraction equipment with respect to line position and intensity as a function of 2θ-angle. The sintered form of the SRM eliminates the effect of sample loading procedures on intensity measurements. Certified data include the lattice parameters and relative peak intensity values from 13 lines in the 2θ region between 20° and 145° using Cu radiation. A NIST-built diffractometer, incorporating many advanced and unique design features was used to make the certification measurements.

Copyright

Corresponding author

a) Author to whom correspondence should be addressed. Electronic mail: david.black@nist.gov

References

Hide All
Azaroff, L. V. (1955). “Polarization correction for crystal-monochromatized x-radiation,” Acta Crystallogr. 8, 701704.
Bergmann, J., Kleeberg, R., Haase, A., and Breidenstein, B. (2000). “Advanced Fundamental Parameters Model for Improved Profile Analysis,” in Proc. of the 5th European Conf. on Residual Stresses, Delft-Noordwijkerhout, The Netherlands, September 29–30, 1999, edited by Böttger, A. J., Delhez, R. and Mittemeijer, E. J. (Material Science Forum), Vol. 347–349, pp. 303308.
Black, D. R., Windover, D., Henins, A., Filliben, J., and Cline, J. P. (2011). “Certification of standard reference material 660B,” Powder Diffr. 26(2), 155158.
Cheary, R. W. and Coelho, A. A. (1992). “A fundamental parameters approach to X-ray line-profile fitting,” J. Appl. Crystallogr. 25, 109121.
Cheary, R. W. and Coelho, A. A. (1998a). “Axial divergence in a conventional x-ray powder diffractometer I. theoretical foundations,” J. Appl. Crystallogr. 31, 851861.
Cheary, R. W. and Coelho, A. A. (1998b). “Axial divergence in a conventional x-ray powder diffractometer II. implementation and comparison with experiment,” J. Appl. Crystallogr. 31, 862868.
Cline, J. P., Black, D., Windover, D., and Henins, A. (2013). “The Calibration of Laboratory X-Ray Diffraction Equipment Using NIST Standard Reference Materials, Chapter 13,” in Modern Diffraction Methods, edited by Mittemeijer, E. J. and Welzel, U. (Wilcy-VCH, Weinheim, Germany), pp. 399438.
Cline, J. P., Mendenhall, M. H., Black, D., Windover, D., and Henins, A. (2015). “The optics, alignment and calibration of laboratory X-ray powder diffraction equipment with the use of NIST standard reference materials,” Int. Tables Crystallogr. H: Powder Diffraction , in press.
Finger, L. W., Cox, D. E., and Jephcoat, A. P. (1994). “A correction for powder diffraction peak asymmetry due to axial divergence,” J. Appl. Crystallogr. 27, 892900.
Guinier, A. (1994). X-Ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies (Courier Dover Publications, N. Chelmsford, Massachusetts).
HighScore Plus. V3.0d PANalytical (BV Almelo, The Netherlands).
Hölzer, G., Fritsch, M., Deutsch, M., Härtwig, J., and Förster, E. (1997). “1,2 and Kβ1,3 x-ry emission lines of the 3d transition metals,” Phys. Rev. A 56(6), 45544568.
ISO (1993). Guide to the Expression of Uncertainty in Measurement; ISBN 92-67-10188-9 (International Organization for Standardization, Geneva, Switzerland), 1st ed.
Jenkins, R. (1992). Round Robin on Powder Diffractometer Sensitivity; ICDD Workshop at the Conference Accuracy in Powder Diffraction II; NIST Gaithersburg, May 26–29.
Larson, A. C. and Von Dreele, R. B. (2003). General Structure Analysis System (GSAS); Report LAUR 86–748 (Los Alamos National Laboratory, Los Alamos, New Mexico).
Maskil, M. and Deutsch, M. (1988). “X-ray Kα satellites of copper,” Phys. Rev. A 38, 34673472.
Rietveld, H. M. (1967). “Line profiles of neutron powder-diffraction peaks for structure refinement,” Acta Crystallogr. 22, 151152.
Rietveld, H. M. (1969). “A profile refinement method for nuclear and magnetic structures,” J. Appl. Crystallogr. 2, 6571.
Shvyd'ko, Yu. V., Lucht, M., Gerdaua, E., Lerche, M., Alp, E. E., Sturhahn, W., Sutter, J., and Toellner, T. S. (2002). “Measuring wavelengths and lattice constants with the mossbauer wavelength standard,” J. Synchr. Radiat. 9, 1723.
SRM 660b (2009). Line Position and Line Shape Standard for Powder Diffraction (National Institute of Standards and Technology; U.S. Department of Commerce, Gaithersburg, MD).
SRM 676a (2008). Alumina Internal Standard for Quantitative Analysis by Powder Diffraction (National Institute of Standards and Technology; U.S. Department of Commerce, Gaithersburg, MD).
Taylor, B. N. (1995). Guide for the Use of the International System of Units (SI) (NIST Special Publication 811; U.S. Government Printing Office, Washington, DC).
TOPAS. (2009). General Profile and Structure Analysis Software for Powder Diffraction Data, V4.2, (Bruker AXS GmbH, Karlsruhe, Germany).
Thompson, P., Cox, D. E., and Hastings, J. B. (1987). “Rietveld refinement of Debye-Scherrer synchrotron X-ray data from Al2O3 ,” J. Appl. Crystallogr. 20, 7983.
Yao, T. and Jinno, H. (1982). “Polarization factor for the X-ray powder diffraction method with a single crystal monochromator,” Acta Crystallogr. A 38, 287288.

Keywords

Certification of Standard Reference Material 1976B

  • David R. Black (a1), Donald Windover (a1), Marcus H. Mendenhall (a1), Albert Henins (a1), James Filliben (a1) and James P. Cline (a1)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed