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Improvement of X-ray stress measurement from a Debye–Scherrer ring by oscillation of the X-ray incident angle

Published online by Cambridge University Press:  12 August 2015

Toshiyuki Miyazaki
Affiliation:
Kanazawa Universiyt, Kanazawa city, 920-1165, Japan
Yoichi Maruyama
Affiliation:
Kanazawa Universiyt, Kanazawa city, 920-1165, Japan
Yohei Fujimoto
Affiliation:
Kanazawa Universiyt, Kanazawa city, 920-1165, Japan
Toshihiko Sasaki
Affiliation:
Kanazawa Universiyt, Kanazawa city, 920-1165, Japan
Corresponding

Abstract

A technique to improve the stress measurement from a Debye–Scherrer ring (D–S ring) is reported. In a previous work, the authors reported a technique to calculate stress from the Fourier series of the normal strain of a D–S ring. That technique, similar to the cosα method that came before it, is inaccurate when the grain size of the specimen is relatively large. To cope with this problem, the authors propose using the oscillation of the X-ray incident angle. The present study demonstrates this technique to improve the stress measurement.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2015 

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References

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Improvement of X-ray stress measurement from a Debye–Scherrer ring by oscillation of the X-ray incident angle
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