In recent years a separate branch of electron microscopy, which can conveniently be termed “Solid State Electron Microscopy” has evolved into a discipline of its own, which makes use of a set of techniques such as
- diffraction contrast electron microscopy
- high resolution transmission electron microscopy
- selected area electron diffraction
- convergent beam electron diffraction
- optical diffraction of high resolution electron micrographs
and which allows to provide information on a wide variety of solid state phenomena. With the availability of microscopes with a resolution equal to interatomic distances its field of application has recently been extended greatly.