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ZnO Based SAW Delay Line: Thin Film Characteristics and IDT Fabrication

  • Farid Hassani (a1), Shahrokh Ahmadi (a1), Can E. Korman (a1), Mona Zaghloul (a1), Shiva Hullavarad (a2), R.D. Vispute (a2) and T. Venkatesan (a2)...

Abstract

ZnO, a well-known piezoelectric material, is used to develop micro-scale Surface Acoustic Wave (SAW) delay line sensor. In this work, SAW delay line Devices are fabricated employing ZnO films that are deposited by RF sputtering technique. Films are characterized prior to device fabrication by X-Ray Diffraction (XRD) for film crystalline quality, UV-visible transmission spectroscopy for optical characteristics, and Atomic Force Microscopy (AFM) for surface morphology. Interdigital electrodes producing surface acoustic waves in the hundreds of MHz are developed by photolithography and metalization techniques. SAW delay line device testing, measurement and characteristics on RF sputtered ZnO films are presented and compared.

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[1] Morgan, D.P., “Surface-Wave Devices for Signal Processing”, Elsevier, Amsterdam, 1985.
[2] Smith, W.R., Gerard, H.M., Collins, J.H., Reeder, T.M., Shaw, H.J., “Analysis of interdigital surface wave transducer by use of an equivalent circuit model”, IEEE Trans. MTT, vol. 17, 1969, pp. 856864.10.1109/TMTT.1969.1127075
[3] Campbell, C., “Surface Acoustic Wave Devices and Their Signal Processing Applications”, Academic Press, San Diego, 1989.
[4] Taha, T.E., “A Simple Technique for determining Losses in SAW Delay Line”, IEEE, 1995.
[5] Klamtar-zadeh, K., Wlodarski, W., Holland, A. and Reeves, G., “A Zno/SiO2/Si (100) love mode transducer”, IEEE Ultrasonic symposium, 2000.

ZnO Based SAW Delay Line: Thin Film Characteristics and IDT Fabrication

  • Farid Hassani (a1), Shahrokh Ahmadi (a1), Can E. Korman (a1), Mona Zaghloul (a1), Shiva Hullavarad (a2), R.D. Vispute (a2) and T. Venkatesan (a2)...

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