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X-Ray Studies of Gasb/Sb Heterostructure and Multilayers: A New Semimetal/Semiconductor System

Published online by Cambridge University Press:  25 February 2011

A. Vigliante ,
P. C. Chow ,
S. C. Moss ,
J. A. Dura ,
W. C. Wang  and
T. D. Golding
A. Vigliante
Affiliation:
University of Houston, Department of Physics and Space Vacuum Epitaxy Center, Houston, TX 77204–5506.
P. C. Chow
Affiliation:
University of Houston, Department of Physics and Space Vacuum Epitaxy Center, Houston, TX 77204–5506.
S. C. Moss
Affiliation:
University of Houston, Department of Physics and Space Vacuum Epitaxy Center, Houston, TX 77204–5506.
J. A. Dura
Affiliation:
University of Houston, Department of Physics and Space Vacuum Epitaxy Center, Houston, TX 77204–5506.
W. C. Wang
Affiliation:
University of Houston, Department of Physics and Space Vacuum Epitaxy Center, Houston, TX 77204–5506.
T. D. Golding
Affiliation:
University of Houston, Department of Physics and Space Vacuum Epitaxy Center, Houston, TX 77204–5506.
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Extract

A substantial research effort has been devoted to the growth of metals on semiconductors [1], motivated in part by the necessity of electrical contacts and interconnects in semiconducting devices and by the possibility of new physical phenomena and devices derived from the combination of electronic properties of the two materials. Semimetals provide an alternative for applications involving electrical contact, for which their unique transport, optical, and nonlinear properties make them attractive in hybrid devices.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 281: Symposium D – Semiconductor Heterostructures for Photonic and Electronic Applications , 1992 , 721
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. For an excellent review see: Sands, T., Palmstrom, C. J., Harbison, J. P., Keramidas, V. G., Tabatanaie, N., Cheeks, T. L., Ramesh, R. and Silberberg, Y., Materials Science Reports, 5 (3), 99 (1990).Google Scholar
2. Harbison, J. P., Sands, T., Tabatabie, N., Chan, W. K., Florez, L. T. and Keramidas, V. G., Appl. Phys. Lett. 53, 1717 (1988).Google Scholar
3. Golding, T.D., Dura, J.A., Wang, W.C., Vigliante, A., Moss, S.C., Chen, H.C., Miller, J.H., Hoffman, C.A. and Meyer, J.R., Appl. Phys. Lett. (to be published).Google Scholar
4. Strukturbericht (Leipzig: Akademische Verlagsgesellshaft, 1931–1943)Google Scholar
5. Warren, B.E., X-Ray Diffraction, ed. (Dover, New York, reprint 1990) p. 25.Google Scholar