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X-ray Photoemission Determination of the Surface Fermi Level Motion and Pinning on n- and p-GaN during the Formation of Au, Ni, and Ti Metal Contacts

  • Kimberly A. Rickert (a1), Jong Kyu Kim (a2), Jong-Lam Lee (a2), Franz J. Himpsel (a3), Arthur B. Ellis (a1) and T. F. Kuech (a4)...

Abstract

Synchrotron radiation-based x-ray photoemission spectroscopy was used to study the Fermi level position within the band gap for thin metal overlayers of Au, Ni, and Ti on n-GaN and p-GaN. The Fermi level position was determined with the measured Fermi edge of the metal on the sample in order to correct for the presence of non-equilibrium effects. There are two different behaviors observed for the three metals studied. For Au and Ti, the surface Fermi positions on n-GaN and p-GaN are roughly 0.5 eV apart within the band gap. For Ni, the n-GaN and p-GaN have a Schottky barrier that forms at the same place at the gap.

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1. Nakamura, S., MRS Bulletin 22 (2)), 2935 (1997).
2. Nakamura, S., The blue laser diode: The complete story (Springer, Berlin, 2000).
3. Binari, S. C., Doverspike, K., Kelner, G. et al., Solid State Electronics 41 (2)), 177180 (1997).
4. Sun, J., Rickert, K. A., Redwing, J. M. et al., Appl. Phys. Lett. 76 (4)), 415417 (2000).
5. Rickert, K. A., Jingxi Sun, Ellis, A. B. et al., Appl. Phys. Lett. to be published (2001).
6. Lee, J. -L., Kim, J. K., Lee, J. W. et al., Phys. Stat. Sol. A 176, 763766 (1999).
7. Kim, J. K., Lee, J. -L., Lee, J. W. et al., J. Vac. Sci. Technol. B 17, 497499 (1999).
8. Kim, Jong Kyu, Kim, Ki-Jeong, Kim, Bongsoo et al., J. Electron. Mater. 30 (3)), 129133 (2001).
9. Suzue, K., Mohammad, S. N., Fan, Z. F. et al., J. Appl. Phys. 80 (8)), 44674478 (1996).
10. Kaminska, E., Piotrowska, A., Guziewicz, M. et al., Mater. Res. Soc. Symp. Proc. 449, 10551060 (1997).
11. Binari, S. C., Dietrich, H. B., Kelner, G. et al., Electron. Lett. 30 (11)), 909911 (1994).
12. Piquette, E. C., Bandic, Z. Z., and McGill, T. C., Mater. Res. Soc. Symp. Proc. 482, 10891094 (1998).
13. Schmitz, A. C., Ping, A. T., Khan, M. Asif et al., J. Electron. Mater. 27 (4)), 255260 (1998).
14. DeLucca, J. M., Mohney, S. E., Auret, F. D. et al., J. Appl. Phys. 88 (5)), 25932600 (2000).
15. Qiao, D., Yu, L. S., Lau, S. S. et al., J. Appl. Phys. 88, 41964200 (2000).
16. Mistele, D., Fedler, F., Klausing, H. et al., J. Cryst. Growth 230, 564568 (2001).
17. Kwak, J. S., Mohney, S. E., Lin, J.-Y. et al., Semicond. Sci. Technol. 15, 756760 (2000).
18. King, D. J., Zhang, L., Ramer, J. C. et al., Mater. Res. Soc. Symp. Proc. 468, 421426 (1997).
19. Chen, L. -C., Ho, J, -K., Jong, C.-S. et al., Appl. Phys. Lett. 76, 37033705 (2000).
20. Jang, J. -S., Chang, I. -S., Kim, H.-K. et al., Appl. Phys. Lett. 74, 7072 (1999).
21. Kim, T., Yoo, M. C., and Kim, T., Mater. Res. Soc. Symp. Proc. 449, 10611065 (1997).
22. Ruvimov, S., Liliental-Weber, Z., Washburn, J. et al., Appl. Phys. Lett. 69, 15561558 (1996).
23. Lee, J. -L. and Kim, J. K., J. Electrochem. Soc. 147 (6)), 22912302 (2000).
24. Liu, Q. Z., Yu, L. S., Deng, F. et al., J. Appl. Phys. 84 (2)), 881886 (1998).
25. Liu, Q. Z., Shen, L., Smith, K. V. et al., Appl. Phys. Lett. 70, 990992 (1997).
26. Hüfner, Stefan, Photoelectron Spectroscopy, 2 ed. (Springer-Verlag, Berlin, 1996).
27. Himpsel, F. J., Surf. Sci. Rep. 12 (1)), 148 (1990).
28. Alonso, M., Cimino, R., and Horn, K., Phys. Rev. Lett. 64 (16)), 19471950 (1990).
29. Rhoderick, E. H. and Williams, R. H., Metal-Semiconductor Contacts, 2nd ed. (Oxford University Press, Oxford, 1988).

X-ray Photoemission Determination of the Surface Fermi Level Motion and Pinning on n- and p-GaN during the Formation of Au, Ni, and Ti Metal Contacts

  • Kimberly A. Rickert (a1), Jong Kyu Kim (a2), Jong-Lam Lee (a2), Franz J. Himpsel (a3), Arthur B. Ellis (a1) and T. F. Kuech (a4)...

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