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X-Ray Microbeam Quantification of Grain Subdivision Accompanying Large Deformations of Copper

  • G. C. Butler (a1), A. Guvenilir (a2), D. L. McDowell (a3) (a1) (a2) and S. R. Stock (a3) (a2)

Abstract

Polychromatic synchrotron x-ray microbeams offer a very efficient alternative to electron beam methods for quantifying the amount and character of grain subdivision accompanying large deformations. With a 0.01 mm diameter collimator, bending magnet radiation from a 3.0 GeV source and image storage plates, samples of copper with thicknesses greater than 0.1 mm have been studied. Results from an as-received sample and a sample deformed to 100% torsion are compared and illustrate how efficiently grain subdivision can be quantified with polychromatic microbeam diffraction.

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X-Ray Microbeam Quantification of Grain Subdivision Accompanying Large Deformations of Copper

  • G. C. Butler (a1), A. Guvenilir (a2), D. L. McDowell (a3) (a1) (a2) and S. R. Stock (a3) (a2)

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