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X-Ray Diffraction From Surfaces and Interfaces: Atomic Structure and Morphology

  • E. Vlieg (a1) (a2), I.K. Robinson (a2) and J.F. van der Veen (a1)

Abstract

The emergence of synchrotron radiation sources has greatly stimulated the use of X-ray scattering in surface science. The absence of multiple-scattering effects allows a straightforward data analysis. In addition to determining geometric structures, it is also possible with X-ray scattering to obtain information on various types of surface disorder. The large penetration depth enables the investigation of interfaces.

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X-Ray Diffraction From Surfaces and Interfaces: Atomic Structure and Morphology

  • E. Vlieg (a1) (a2), I.K. Robinson (a2) and J.F. van der Veen (a1)

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