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Vertical-Cavity Optoelectronic Structures: CAD, Growth, and Structural Characterization

  • D. H. Christensen (a1), S. M. Crochiere (a2), J. G. Pellegrino (a3), R. S. Rai (a2), C. A. Parsons (a2), W. F. Tseng (a3) and R. K. Hickernell (a1)...

Abstract

Simulations of reflectance spectra and electric field distributions for vertical-cavity structures were used in the computer aided design of epitaxial mirrors and lasers. The binary GaAs/AlAs superlattice alloys and AlxGa1−xAs random alloys that compose these structures were grown by molecular beam epitaxy. Photoluminescence, photoreflectance, reflectance spectroscopy, scanning electron microscopy, transmission electron microscopy, and double crystal x-ray diffractometry were applied to characterize cavity and Bragg mirror layer thicknesses and alloy composition.

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Vertical-Cavity Optoelectronic Structures: CAD, Growth, and Structural Characterization

  • D. H. Christensen (a1), S. M. Crochiere (a2), J. G. Pellegrino (a3), R. S. Rai (a2), C. A. Parsons (a2), W. F. Tseng (a3) and R. K. Hickernell (a1)...

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