Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-19T15:26:26.955Z Has data issue: false hasContentIssue false

Variable Temperature Measurement on Operating Pentacene-Based OTFT

Published online by Cambridge University Press:  01 February 2011

Hung-Keng Chen
Affiliation:
hkchen@ndl.org.tw, National Nano Device Laboratories, Core Facility, No.26, Prosperity Road 1, Science-based Industrial Park,, Hsinchu, 30078, Taiwan
Po-Tsun Liu
Affiliation:
ptliu@mail.nctu.edu.tw, National Chiao Tung University, Department of Photonics and Display Institute, Hsinchu, 30078, Taiwan
Ting-Chang Chang
Affiliation:
tcchang@mail.phys.nsysu.edu.tw, National Sun Yat-Sen University, Department of Physics and Institute of Electro-Optical Engineering, Kaohsiung, 80424, Taiwan
S.-L. Shy
Affiliation:
shy@ndl.org.tw, National Nano Device Laboratories, No.26, Prosperity Road 1, Science-based Industrial Park,, Hsinchu,, 30078, Taiwan
Get access

Abstract

Variable temperature electrical measurement is well-established and used for determining the conduction mechanism in semiconductors. There is a Meyer¡VNeldel relationship between the activation energy and the prefactor with a Meyer¡VNeldel energy of 30.03 meV, which corresponds well with the isokinetic temperature of about 350 K. Therefore, the multiple trapping and release model is properly used to explain the thermally activated phenomenon. By the method, an exponential distribution of traps is assumed to be a better representation of trap states in band tail. Samples with higher temperature during measurement are observed to show better mobility, higher on-current and lower resistance, which agree well with the multiple trapping and release model proposed to explain the conduction mechanism in pentacene-based OTFTs.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Pope, M. and Swenberg, C. E. Electronic Processes in Organic Crystals (Oxford University Press, New York, 1982).Google Scholar
[2] Brown, A. R. Jarrett, C. P. Leeuw, D. M. de and Matters, M., Synth. Met., 88, 37 (1997).Google Scholar
[3] Horowitz, G., Hajlaoui, R. and Delannoy, P., J. Phys. III 5, 355 (1995).Google Scholar
[4] Nelson, S. F. Lin, Y.Y. Gundlach, D. J. and Jackson, T. N. Appl. Phys. Lett., 72, 1854 (1998).Google Scholar
[5] Schön, J. H. and Batlogg, B., Appl. Phys. Lett., 74, 260 (1998).Google Scholar
[6] Schoonveld, W. A. Wildeman, J., Fichou, D., Bobbert, P. A. Wees, B. J. van and Klapwijk, T. M. Nature (London), 404, 977 (2000).Google Scholar
[7] Torsi, L., Dodabalapur, A., Rothberg, L. J. Fung, A. W. P. and Katz, H. E. Phys. Rev. B, 57, 2271 (1998).Google Scholar
[8] Vissenberg, M. C. J. M. and Matters, M., Phys. Rev. B, 57, 12964 (1998).Google Scholar
[9] Schön, J. H., Berg, S., Kloc, Ch. and Batlogg, B., Science, 287, 1022 (2000).Google Scholar
[10] Chesterfield, Reid J., McKeen, John C., Newman, Christopher R. and Frisbie, C. Daniel J. Appl. Phys., 95, 11, 6396 (2004)Google Scholar