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Vacancy Supersaturation Model for Electromigration Failure Under DC and Pulsed DC Stress

  • J. J. Clement (a1)

Abstract

Time-dependent vacancy concentration profiles are calculated numerically as solutions to the electromigration transport equation under dc and pulsed dc current stress conditions in finite-length conductors. An electromigration model based on the buildup of a critical vacancy supersaturation to initiate failure agrees well with several reported experimental observations.

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