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Twinning in epilayers of CdTe on <211> Si: Influence of ZnTe buffer layer and substrate misorientation

  • A. Gray (a1), N.K. Dhar (a1), W. Clark (a1), P. Charlton (a1), J.H. Dinan (a2), R. Segnan (a3) and W.E. Mayo (a4)...

Abstract

X-ray diffraction spectra of CdTe epilayers grown with and without ZnTe buffer layers on <211> Si substrates by molecular beam epitaxy consist of 422 and 331 reflections. We interpret these as evidence for the existence of twins within the volume of a <211> oriented epilayer and show that twin volume is dependent on the ZnTe buffer layer and substrate misorientation.

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Twinning in epilayers of CdTe on <211> Si: Influence of ZnTe buffer layer and substrate misorientation

  • A. Gray (a1), N.K. Dhar (a1), W. Clark (a1), P. Charlton (a1), J.H. Dinan (a2), R. Segnan (a3) and W.E. Mayo (a4)...

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