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Transmission Electron Microscopy Studies of NiFe/Cu/Co/Cu on Si.

Published online by Cambridge University Press:  03 September 2012

P. Gautier ,
T. Valet ,
O. Durand ,
J.C. Jacquet  and
J.P. Chevalier
P. Gautier
Affiliation:
Laboratoire Central de Recherches, Thomson-CSF,91404 Orsay, France
T. Valet
Affiliation:
Laboratoire Central de Recherches, Thomson-CSF,91404 Orsay, France
O. Durand
Affiliation:
Laboratoire Central de Recherches, Thomson-CSF,91404 Orsay, France
J.C. Jacquet
Affiliation:
Laboratoire Central de Recherches, Thomson-CSF,91404 Orsay, France
J.P. Chevalier
Affiliation:
Laboratoire Central de Recherches, Thomson-CSF,91404 Orsay, France
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Abstract

(NiFe/Cu/Co/Cu) Multilayers grown on (100) Si by RF sputtering have been studied by transmission electron Microscopy. The samples are found to be polycristalline and are only weakly textured. The period of the multilayers is clearly visible by small angle electron diffraction and Fresnel imaging. The waviness of the layers appears to be related to the columnar structure of the samples. Experimental images with Fresnel contrast are compared with simulations in order to assess the thickness and roughness of each individual layer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 313: Symposium Q1 – Magnetic Ultrathin Films, Multilayers and Surfaces/Magnetic Interfaces-Physics and Characterizations , 1993 , 749
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Baibich, M.N., Broto, J.M., Fért, A., Nguyen Van Dau, N., Petroff, F., Etienne, P., Creuzet, G., Friederich, A. and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).Google Scholar
2. Pratt, W.P. Jr, Lee, S.F., Slaughter, J.M., Loloee, R., Schroeder, P.A. and Bass, J., Phys. Rev. Lett. 66, 3060 (1991).Google Scholar
3. Valet, T., Jacquet, J.C., Galtier, P., Coutellier, J.M., Pereira, L.G., Morel, R., Lottis, D. and Fert, A., Appl. Phys. Lett. 61, 3187 (1992).Google Scholar
4. Valet, T., Galtier, P., Jacquet, J.C., Meny, C. and Panissod, P., J. Magn. Magn. Mater. 121, (1993).Google Scholar
5. Meny, C., Panissod, P. and Loloee, R., Phys. Rev. B 45, 12269 (1992).Google Scholar
6. Parkin, S.S.P., Li, Z.G. and Smith, D.J., Appl. Phys. Lett. 58, 2710 (1991).Google Scholar
7. Clarke, D.R., Ultramicroscopy 4, 33 (1979).Google Scholar
8. Ness, J.N., Stobbs, W. and Page, T.F., Phil. Mag. A 54, 679 (1986).Google Scholar
9. Ness, J.N., Stobbs, W., Phil. Mag. A 63, 1 (1991).Google Scholar
10. Mellül, S., PhD Thesis, University Paris 6 (1988).Google Scholar