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Towards Imaging with Polycrystalline Mercuric Iodide Semiconductor Detectors

Published online by Cambridge University Press:  10 February 2011

M. Schieber
Affiliation:
The Hebrew University of Jerusalem, Jerusalem 91904, Israel Also at Sandia National Laboratories, Livermore Ca 94550
A. Zuck
Affiliation:
The Hebrew University of Jerusalem, Jerusalem 91904, Israel
M. Braiman
Affiliation:
The Hebrew University of Jerusalem, Jerusalem 91904, Israel
L. Melekhov
Affiliation:
The Hebrew University of Jerusalem, Jerusalem 91904, Israel
J. Nissenbaum
Affiliation:
The Hebrew University of Jerusalem, Jerusalem 91904, Israel
R. Turchetta
Affiliation:
LEPSI (ULP/IN2P3), Strasbourg, France
W. Dulinski
Affiliation:
LEPSI (ULP/IN2P3), Strasbourg, France
D. Husson
Affiliation:
LEPSI (ULP/IN2P3), Strasbourg, France
J. L. Riester
Affiliation:
LEPSI (ULP/IN2P3), Strasbourg, France
T. E. Schlesinger
Affiliation:
Dep. of Electr. and Computer Eng., Camige Mellon University, Pittsburgh, PA 15213, USA
J. Toney
Affiliation:
Dep. of Electr. and Computer Eng., Camige Mellon University, Pittsburgh, PA 15213, USA
S. Sanguinetti
Affiliation:
I.N.F.M. and Dipartimento di Scienza dei Materiali, Universita'degli Studi di Milano, I-20126 Milano, Italy
M. Montalti
Affiliation:
I.N.F.M. and Dipartimento di Scienza dei Materiali, Universita'degli Studi di Milano, I-20126 Milano, Italy
M. Guzzi
Affiliation:
I.N.F.M. and Dipartimento di Scienza dei Materiali, Universita'degli Studi di Milano, I-20126 Milano, Italy
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Abstract

Preparation of polycrystalline mercuric iodide very thin (1 μm) films using laser ablation and thick films (100–600μm), using hot pressing, hot wall vapor deposition and screen printing methods, fabricated as radiation detector plates are briefly described. X-ray diffraction, photoluminescence and optical microscopic measurements as well as response to nuclear radiation will be given. Finally, recent results obtained with a large area imaging pixel detector will be shown.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

1. Schieber, M., Zuck, A., Braiman, M., Nissenbaum, J., Turchetta, R., Dulinski, W., Husson, D., , J. L., “Evaluation of Mercuric Iodide Ceramic Semiconductor Detectors”, presented at the 5th International Conference on Advanced Technology and Particle Physics, Villa Olmo, Como (Italy), October 7–11, 1996, accepted for publication in Nuclear Physics B, 1997.Google Scholar
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