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Time-Resolved Spectroscopy of Plasma Resonances In Highly Excited Silicon And Germanium

Published online by Cambridge University Press:  26 February 2011

A. M. Malvezzi
Affiliation:
Division of Applied Sciences, Harvard Universitu, Cambridge, MA 02138
C. Y. Huang
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545
H. Kurz
Affiliation:
Technical University Aachen, D-5100 Aachen, Federal Republic of Germany
N. Bloembergen
Affiliation:
Division of Applied Sciences, Harvard Universitu, Cambridge, MA 02138
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Abstract

The dynamics of the electron-hole plasma in silicon and germanium samples irradiated by 20 ps, 532 nm laser pulses has been investigated in the near infrared by time-resolved picosecond optical spectroscopy. The experimental reflectivities and transmissions are compared with the redictions of the thermal model for degenerate carrier distributions through the Drue iformalism. Above a certain fluence, a significant deviation between measured and calculated values indicates a strong increase of the recombination rate as soon as the plasma resonances become comparable with the band gaps. These new plasmon-aided recombination channels are particularly pronounced in germanium.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. Bloembergen, N., in “Beam-Solid Interscticns gndlhA:se Transformetions” edited by Kurz, H., Olson, G. L. and Poate, J. M., Mat. Res. Soc. Symp. Proc., 1986 (to be published), and references quoted therein.Google Scholar
2. Lompre, L.-A., Liu, J. M., Kurz, H. and Bloembergen, N., Appl. Phys. Lett. 43. 168(1983).Google Scholar
3. Lompre, L.-A., Liu, J. M., Kurz, H. and Bloembergen, N., Appl. Phys. Lett. 44. 3 (1984)CrossRefGoogle Scholar
4. Kurz, H., Malvezzi, A. M., Lompre, L.-A. in Proceedings of the IXIh Inteticla Conferexnce a7 the Phgysis of Semi uctors, edited by Chadi, J. D., Harrison, W. A. (Springer, Berlin, 1985)Google Scholar
5. Malvezzj, A. M., Kurz, H. and Broembergen, N., Appl. Phys. 36 143 (1985)Google Scholar
6. Lompre, L.-A., Kurz, H. and Bloembergen, N., in Ultrafast Phenomienda IV edited by Auston, D. M. and Eisentlhal, K. B. (Springer New York, 1984)Google Scholar
7. Gallant, M. I., Driel, H. M. van, Phys. Rev. B 26. 2133 (1982)CrossRefGoogle Scholar
8. Driel, H. M. van, Lompre, L.-A. and Bloembergen, N., Appl. Phys. Lett. 44 285 (1984)Google Scholar
9. Rasolt, M. and Kurz, H., Phys. Rev. Lett. 54. 722 (1985)CrossRefGoogle Scholar
10. Wolff, P. A., Phgs. Rev. Left. 24, 266 (1970); A. Elci, M. O. Scully, A. L. Smir I, J. C. Matter, Phys. Rev. B A 191 (1977)Google Scholar
11. Baeri, P., Campisano, U., Foti, G. and Rimini, E., J. Appl. Phys. 5 788 (1979)CrossRefGoogle Scholar
12. Lietola, A. and Gibbons, J. F., Mat. Res. Soc. Symp. Proc. 4 163 (1982)Google Scholar
13. Kurz, H. and Bloembergen, N., Mat. Res. Soc. Symp. Proc. 35 3 (1985)CrossRefGoogle Scholar
14. Joffa, E., Phys. Rev. B 21 2415 (1980)Google Scholar
14. Meyer, J. M., Kruer, M. R., Bartoli, J. F., J. Appl. Phys. 51 5513 (1980)CrossRefGoogle Scholar
15. Liu, J. M., Malvezzlan, A. M., Bloembergen, N., in “Beam-Solid Interactios and Phase Trarnsfcrmations” edited bq Kurz, H., Olson, G. L. and Poate, J. M., Mat. Res, Soc. Symp. Proc., 1986 (to be pubished)Google Scholar