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Three Dimensional Simulation of the Morphological Evolution of a Strained Film on a Thick Substrate
Published online by Cambridge University Press: 10 February 2011
Abstract
This paper presents a three-dimensional simulation for the surface evolution of a strained film on a thick substrate. The simulation shows that an initially random morphology will first transform into a profile dominated by two-dimensional ridges, and then into a three-dimensional island surface. The simulation also demonstrates that the ridge-island transition is a kinetic process which can be delayed by changing the initial morphology.
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- Copyright © Materials Research Society 1998