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Thickness Dependent Effects of Thermal Annealing and Solvent Vapor Treatment of Poly (3-hexylthiophene) and Fullerene Bulk Heterojunction Photovoltaics

Published online by Cambridge University Press:  01 February 2011

Zhouying Zhao ,
Lynn Rice ,
Harry Efstathiadis  and
Pradeep Haldar
Zhouying Zhao
Affiliation:
College of Nanoscale Science and Engineering, University at Albany, State University of New York, 255 Fuller Road, Albany, NY 12203, U.S.A.
Lynn Rice
Affiliation:
College of Nanoscale Science and Engineering, University at Albany, State University of New York, 255 Fuller Road, Albany, NY 12203, U.S.A.
Harry Efstathiadis
Affiliation:
College of Nanoscale Science and Engineering, University at Albany, State University of New York, 255 Fuller Road, Albany, NY 12203, U.S.A.
Pradeep Haldar
Affiliation:
College of Nanoscale Science and Engineering, University at Albany, State University of New York, 255 Fuller Road, Albany, NY 12203, U.S.A.
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Abstract

We have utilized room-temperature solvent vapor treatment followed by thermal annealing to process bulk heterojunction (BHJ) photovoltaic devices based on blends of poly (3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) of varied active layer thickness. The morphological and photovoltaic performance characteristics of the cells subject to these treatments were found to be dependent on active layer thickness. The devices were characterized using atomic force microscopy (AFM) and opto-electrical and external quantum efficiency measurements in order to analyze the mechanism underlying the observed trend. Performance indicators including fill factor, short-circuit current and power conversion efficiency were correlated to the ordering of device active layers and morphology. The maximum power conversion efficiency achieved was 4.1 %.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1123: Symposium P – Photovoltaic Materials and Manufacturing Issues , 2008 , 1123-P05-08
Copyright
Copyright © Materials Research Society 2009

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