Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-18T10:43:52.800Z Has data issue: false hasContentIssue false
  • English
  • Français

Thermoreflectance Measurements of the Temperature Distributions in Laser Diodes with Non Injected Facet

Published online by Cambridge University Press:  01 February 2011

Tomasz Ochalski ,
Dorota Pierscinska ,
Kamil Pierscinski ,
Andrzej Malag ,
Agata Jasik ,
Anna Kozlowska  and
Maciej Bugajski
Tomasz Ochalski
Affiliation:
ochalski@ite.waw.pl, Institute of Electron Technology, Z1, Al. Lotnikow 32/46, Warsaw, N/A, 02-668, Poland
Dorota Pierscinska
Affiliation:
dwawer@ite.waw.pl, Institute of Electron Technology, Al. Lotników 32/46, Warsaw, N/A, 02-668, Poland
Kamil Pierscinski
Affiliation:
pierscin@ite.waw.pl, Institute of Electron Technology, Al. Lotników 32/46, Warsaw, N/A, 02-668, Poland
Andrzej Malag
Affiliation:
amal@itme.edu.pl, Institute of Electronic Materials Technology, 133 Wolczynska St., Warsaw, N/A, 01-919, Poland
Agata Jasik
Affiliation:
Agata.Jasik@itme.edu.pl, Institute of Electronic Materials Technology, 133 Wolczynska St., Warsaw, N/A, 01-919, Poland
Anna Kozlowska
Affiliation:
Anna.Kozlowska@itme.edu.pl, Institute of Electronic Materials Technology, 133 Wolczynska St., Warsaw, N/A, 01-919, Poland
Maciej Bugajski
Affiliation:
bugajski@ite.waw.pl, Institute of Electron Technology, Al. Lotników 32/46, Warsaw, N/A, 02-668, Poland
Get access

Abstract

Non Injected Facet (NIF) lasers were developed to increase catastrophic optical damage level of the devices. In this work we present the analysis of the laser diodes (LD) front facet temperature distribution. Micro-thermoreflectance technique is used to perform a detailed temperature maps of the operating LDs. Such a technique gives us temperature maps with a spatial resolution better than 1mm and area of the maps covers active region and substrate crystal. We demonstrate micro thermoreflectance as a perfect tool to determine real temperature distribution of the operating laser diode front facet. Examined series of LDs under investigation have been made in two different ways. Major point of this work is comparison of the front facet temperature distribution of devices with and without injected facets. We compare temperature value and temperature distribution in the waveguide region in both types of the LDs. In our experiment NIF laser diodes exhibit facet temperatures increased by a factor of 1.4.

Keywords

laseroptoelectronicthermal conductivity
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 916: Symposium DD – Solid-State Lighting Materials and Devices , 2006 , 0916-DD06-01
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Chen, G. and Tien, C. L., Facet heating of quantum well lasers, J. Appl. Phys., 74, 2167,1993 Google Scholar
2 Puchert, R., Tomm, J.W., Jaeger, A., Brwolff, A., Luft, J., Spath, W., Appl. Phys. A, 66, 483,1998 Google Scholar
3 Rinner, F., Rogg, J., Kelemen, M. T., Mikulla, M., Weimann, G., Tomm, J.W., Thamm, E., Poprawe, R., J. Appl. Phys., 3, 1848, 2003 Google Scholar
4 Epperlein, P. W., Jpn. J.Appl.Phys., 32, 5514, 1993 Google Scholar
5 Bugajski, M., Piwoski, T., Wawer, D., Ochalski, T.J., Deichsel, E., Unger, P., Corbett, B., Materials Science in Semiconductor Processing, 2006, in printGoogle Scholar
6 Wawer, D., Ochalski, T.J., Piwoski, T., Jedliska, A. Wjcik -, Bugajski, M., Page, H., Phys. Stat. Sol(a),202, 1227, 2005 Google Scholar
7 Epperlein, P. W., Jpn. J. Appl. Phys. 32, 5514, 1993 Google Scholar
8 Matatagui, E., Thompson, A.G., Cardona, M., Phys.Rev. 176,950,1968 Google Scholar
9 DilHaire, S., Grauby, S., Claeys, W., Appl. Phys. Lett. 84,822,2004 Google Scholar
10 Tessier, G., Hole, S., Fournier, D., Appl. Phys. Lett. 78,2267,2001 Google Scholar
11 Malag, A., Bull. Pol. Ac.: Tech. 53, 167, 2005 Google Scholar
12 Ochalski, T. J., Pierciska, D., Pierciski, K., Tomm, J. W., Grunske, T., Kozowska, A., Appl. Phys. Lett.- submittedGoogle Scholar