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Thermoelectric properties of Bi2Te3 based thin films fabricated by pulsed laser deposition

  • Shun Higomo (a1), Takashi Yagi (a2), Haruhiko Obara (a3), Atsushi Yamamoto (a4), Kazuo Ueno (a5), Tsutomu Iida (a6), Naoyuki Taketoshi (a7) and Tetsuya Baba (a8)...

Abstract

Bi2Te3-based thin films were fabricated on glass substrates by the pulsed laser deposition (PLD) method. The vapor pressures of Bi and Te are significantly different, so controlling the stoichiometric composition is difficult when using conventional physical vapor deposition techniques, and the thermoelectric properties of Bi2Te3 films are sensitive to the film composition. PLD is a promising technique for the fabrication of telluride-based films such as Bi2Te3 due to its superior capability for controlling the film composition. Another advantage of PLD is the flexibility that it allows in terms of atmosphere in the reaction chamber; high concentrations of gases such as oxygen or argon can be introduced. We have measured various compositions of Bi2Te3 based films, and have identified the optimal compositions for both n-type and p-type material. The thermal conductivities of these Bi2Te3 films were evaluated by an exact measuring system, and the results were twice as low as those of conventional bulk materials. These results suggest that PLD has significant advantages for the deposition of in-plane Bi2Te3-based thin films.

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1. Scherrer, H., Scherrer, S., CRC Handbook of Thermoelectrics (ed. Rowe, D. M.) 212237 (CRC Press, Boca Raton, FL, 1995).
2. Kullmann, W., Geurts, J., Richter, W. et al. , Phys. Status Solidi (b), 125, 131, 1984.
3. Scherrer, H., Scherrer, S., CRC Handbook of Thermoelectrics (ed. Rowe, D. M.) 218 (CRC Press, Boca Raton, FL, 1995).
4. Black, J., Conwell, E. M., Seigle, L., and Spencer, C. W., J. Phys. Chem. Solids, 2, 240, 1957.
5. Austin, I. G., Proc. Phys. Rev. 72, 545, 1985.
6. Austin, I. G., and Sheard, A., J. Electron. Contrib., 3, 236, 1957.
7. Venkatasubramanian, R., Siivola, E., Colopitts, T., and O'Quinn, B., Nature 413 p.597 (2001).
8. Venkatasubramanian, R., Phys. Rev. B 61, p.3091 (2000).
9. Baba, T., Proceedings of Workshop on Thermal Investigations of ICs and Systems (Therminic 2004), Sophia Antipolis, France, 29 September - 1 October 2004, pp. 241-249.
10. Taketoshi, N., Baba, T. and Ono, A., “Observation of heat diffusion across submicrometer thin films using a picosec-ond thermoreflectance technique”, Jpn. J. Appl. Phys., 38, 11, 12681271, 1999.
11. Higomo, S., Obara, H., Yamamoto, A., Ueno, K., and Iida, T., Proc. of the 26th Inter. Conf. on Thermoelectrics, (Jeju, 2007) to be republished.
12. Makala, R. S., Jagannadham, K., and Sales, B. C., J. Appl. Phys., 94, 6. 39073918, 2003.
13. Stary, Z., Horak, J., Stordeur, M., and Stolzer, M., J. Phys. Chem. Solids, 49, 1, 2934, 1988.
14. Feutelais, Y., Legendre, B., Rodier, N., and Agafanov, V., Materials Research Bulletin, 28, pp.591596, 1993.
15. Barin, I., Thermochemical Data of Pure Substances, 1993, Weinheim:VCH.
16. Ferhat, M., Tedenac, J. C., Nagao, J., J. Crystal Growth, 218, pp.250258, 2000.

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