Skip to main content Accessibility help
×
Home

Thermal stability of Pt nanowires manufactured by Ga+ focused ion beam (FIB)

  • B.J. Inkson (a1) and G. Dehm (a2)

Abstract

Pt nanowires have been produced by FIB deposition of Pt thin films in a commercial Ga+ focused ion beam (FIB) system, followed by cross-sectional sputtering to form electron transparent Pt nanowires. The thermal stability of amorphous FIB manufactured Pt wires has been investigated by in-situ thermal cycling in a TEM. The Pt wires are stable up to 580-650°C where partial crystallization is observed in vacuum. Facetted nanoparticles grow on the wire surface, growing into free space by surface diffusion and minimising contact area with the underlying wire. The particles are fcc Pt with some dissolved Ga. Continued heating results in particle spheroidization, coalescence and growth, retaining the fcc structure.

Copyright

References

Hide All
1. Jawarani, D., Kawasaki, H., Yeo, I-S., Rabenberg, L., Stark, J. P. and Ho, P. S., J. Appl. Phys. 82(4), 1563 (1997).
2. Krämer, S., Mayer, J., Witt, C., Weickenmeier, A and Rühle, M., Ultramicroscopy 81, 245 (2000).
3. Inkson, B. J., Dehm, G. and Wagner, T., Acta Mater. 50, 5033 (2002).
4. Tao, T., Wilkinson, W. and Melngailis, J., J. Vac. Sci. Technol. B 9(1), 162 (1991).
5. Young, R. J. and Puretz, J., J. Vac. Sci. Technol. B 13(6), 2576 (1995).
6. Edinger, K., Melngailis, J. and Orloff, J., J. Vac. Sci. Technol. B 16(6), 3311 (1998).
7. DeMarco, A. J. and Melngailis, J., J. Vac. Sci. Technol. B 17(6), 3154 (1999).
8. Guex, P. and Feschotte, P., J. Less Common Met. 46, 101 (1976).

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed