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Temperature and Frequency Dependencies of Ferroelectric Properties in Rhombohedral Epitaxial Pb(Zr,Ti)O3 Films with Perfect (111) Orientations Grown on CaF2 Substrates.

Published online by Cambridge University Press:  12 April 2012

Yoshitaka Ehara
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, Yokohama, Kanagawa, 226-8502, Japan School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia
Tomoaki Yamada
Affiliation:
Department of Materials, Physics and Energy Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan PRESTO, Japan Science and Technology Agency, Chiyoda-ku, Tokyo 102-0075, Japan
Takashi Iijima
Affiliation:
Research Center for Hydrogen Industrial Use and Storage, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan.
Nagarajan Valanoor
Affiliation:
School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia
Hiroshi Funakubo
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, Yokohama, Kanagawa, 226-8502, Japan
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Abstract

Perfectly (111)-oriented rhombohedral Pb(Zr, Ti)O3 [PZT] films were successfully grown on (111) CaF2 substrates. These films have the polar-axis perpendicular to the substrate surface without non-180o domains. Well saturated polarization (P) –electric field (E) hysteresis loops were observed at various frequencies and temperatures. Temperature dependence of the saturation polarization (Psat.) was in good agreement with the estimated one by Haun et al. using phenomenological approach but did not strongly depend on the measured frequencies. On the other hand, the coercive field (Ec) increased with decreasing temperature and with increasing the measurement frequency.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

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