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Temperature and Frequency Dependencies of Ferroelectric Properties in Rhombohedral Epitaxial Pb(Zr,Ti)O3 Films with Perfect (111) Orientations Grown on CaF2 Substrates.

  • Yoshitaka Ehara (a1) (a2), Tomoaki Yamada (a3) (a4), Takashi Iijima (a5), Nagarajan Valanoor (a2) and Hiroshi Funakubo (a1)...

Abstract

Perfectly (111)-oriented rhombohedral Pb(Zr, Ti)O3 [PZT] films were successfully grown on (111) CaF2 substrates. These films have the polar-axis perpendicular to the substrate surface without non-180o domains. Well saturated polarization (P) –electric field (E) hysteresis loops were observed at various frequencies and temperatures. Temperature dependence of the saturation polarization (P sat.) was in good agreement with the estimated one by Haun et al. using phenomenological approach but did not strongly depend on the measured frequencies. On the other hand, the coercive field (Ec ) increased with decreasing temperature and with increasing the measurement frequency.

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