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A TEM Study of the Microstructure Evolution of Cu(In,Ga)Se2 Films from Cu-Rich to In-Rich

  • Y. Yan (a1), K.M. Jones (a1), J. AbuShama (a1), M.M. Al-Jassim (a1) and R. Noufi (a1)...

Abstract

The microstructure of Cu(In,Ga)Se2 (CIGS) films with compositions ranging from Cu-rich to In-rich was investigated by transmission electron microscopy (TEM) and energy-dispersive Xray spectroscopy (EDS). We found that the Cu-rich samples have larger grain sizes than the Inrich sample. In the Cu-rich samples, sub-interfaces were observed. The two sides of the subinterfaces were found to have different Cu concentration. In the In-rich sample, Ga inhomogeneity across grains was observed.

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A TEM Study of the Microstructure Evolution of Cu(In,Ga)Se2 Films from Cu-Rich to In-Rich

  • Y. Yan (a1), K.M. Jones (a1), J. AbuShama (a1), M.M. Al-Jassim (a1) and R. Noufi (a1)...

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