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TEM Characterization of Planar Defects in A Massively Transformed TiAl Alloy

Published online by Cambridge University Press:  15 February 2011

X. D. Zhang
Affiliation:
Department of materials Science and Engineering, The Ohio State University, 2041 College Road, Columbus, Ohio 43210
J. M. K. Wiezorek
Affiliation:
Department of materials Science and Engineering, The Ohio State University, 2041 College Road, Columbus, Ohio 43210
M. J. Kaufman
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL
M. H. Loretto
Affiliation:
IRC in Materials, The University of Birmingham, B15 2TT, UK
H. L. Fraser
Affiliation:
Department of materials Science and Engineering, The Ohio State University, 2041 College Road, Columbus, Ohio 43210
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Abstract

The microstructure of a massively transformed Ti-49at.%Al alloy has been studied by conventional transmission electron microscopy (CTEM) and high resolution TEM (HREM). A high density of planar defects, namely complex anti-phase domain boundaries (CAPDB) and thermal micro-twins (TMT) have been observed. CTEM images and diffraction patterns showed that two anti-phase related γ-matrix domains were generally separated by a thin layer of a 90°-domain, for which the c-axis is rotated 90° over a common cube axis with respect to those of the γ-matrix domains. HREM confirmed the presence of two crystallographically different types of 90°-do-mains being associated with the CAPDB. Furthermore, interactions between the CAPDB and TMT have been observed. Local faceting of the generally wavy, non-crystallographic CAPDB parallel to the {111}-twinning planes occurred due to interaction with the TMT. The relaxation of the CAPDB onto {111} required diffusion which is proposed to be enhanced locally in the presence of the dislocations associated with the formation of TMT during the massive transformation.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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