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Te Induced AlAs/GaAs Superlattice Mixing

  • P. Mel (a1), S. A. Schwarz (a2), T. Venkatesan (a1), C. L. Schwartz (a2) and E. Colas (a2)...

Abstract

Te enhanced mixing of AlAs/GaAs superlattice has been observed by secondary ion mass spectrometry. The superlattice sample was grown by organometallic chemical vapor deposition and doped with Te at concentrations of 2×1017 to 5×1018 cm−.3 In the temperature range from 700 to 1000 C, a single activation energy for the Al diffusion of 2.9 eV was observed. Furthermore, it has been found that the relationship between the Al diffusion coefficient and Te concentration is linear. Comparisons have been made between Si and Te induced superlattice mixing.

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[1] Deppe, D. G., Guido, L. J., Holonyak, N. Jr., and Hsieh, K. C., Appl. Phys. Lett.,49, 510 (1986)
[2] Kapon, E., Stoffel, N. G., Dobisz, E. A., and Bhat, R., Appl. Phys. Lett.,52, 351 (1988)
[3] Laidig, W. D., Holonyak, N. Jr., Camras, M. D., Hess, K., Coleman, J. J. Dapkus, P. D. and Bardeen, J., Appl. Phys. Lett., 38, 776 (1981)
[4] Kawabe, M., Matsuara, N., Shimizu, N., Hasegawa, F. and Nannichi, Y., Jpn. J. Appl. Phys. Lett., 23, L623 (1984)
[5] Rao, E. V. K., Thibierge, H., Brillouet, F., Alexandre, F., and Azoulay, R., Appl. Phys. Lett. 46, 867 (1985)
[6] Deppe, D. G., Holonyak, N. Jr., Hsieh, K. C., Gavrilovic, P., Stutius, W., and Williams, J., Appl. Phys. Lett.,51, 581 (1987)
[7] Venkatesan, T., Schwarz, S. A., Hwang, D. M., Bhat, R., Yoon, H. W., and Arakawa, Y., Nuclear Inst. and Meths. in Phys. Res., B9/20, 777 (1987)
[8] Mei, P., Venkatesan, T., Schwarz, S. A., Stoffel, N. G., Harbison, J. P., Hart, D. L., and Florez, L. A., to be published in Appl. Phys. Lett.
[9] Nakanura, T., Komita, S., Inata, T., Muto, S., Hiyamizu, S., and Umebu, I. Layered Structures and Epitaxy Symposium, Mater. Res. Soc., 339 (1986)
[10] Milnes, A. G., ”Deep Impurities in Semiconductors”, John Wiley & Son, New York, 1973, p. 59
[11] Mei, P., Yoon, H. W., Venkatesan, T., Schwarz, S. A., and Harbison, J. P., Appl. Phys. Lett., 50, 1823 (1987)
[12] Schwarz, S. A., Venkatesan, T., Bhat, R., Koza, M., Yoon, H. W., Arakawa, Y. and Mei, P., Proc. of the Mat. Res. Soc., Vol. 56, 321
[13] Lee, J. W. and Laidig, W. D., J. Electron. Mater., 13, 147 (1984)
[14] Schwarz, S. A., Venkatesan, T., Mei, P., 1988 MRS Symp. (to be published by Mat. Res. Soc., Pittsburgh, PA)
[15] Willoughby, A. F., Proc. of the Mat. Res. Soc., Vol.14, 237 (1983)

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