The paper reports on the synthesis and structural characterization of amorphous silicon oxide nanowires (SiONWs). The nanowires were prepared using the solid-liquid-solid (SLS) technique and display an average mean diameter in the range of 20-150 nm and 15-20 μm in length. Energy dispersive spectrometry (EDS) analysis revealed that the nanowires consist of Si and O elements in a ratio of approximately 1:2. The result was corroborated by the presence of a single peak at around 103 eV in the X-ray photoelectron (XPS) spectrum. As-prepared SiONWs display blue photoluminescence (PL) centered ∼ 400 nm. The blue luminescence is inhomogeneous with an increase in the PL peak intensity by a factor of 1.8 at certain areas of the surface. Next, we have investigated the effect of high-pressure water vapor annealing (HWA) on the PL and found that while the PL became homogeneous, a decrease of its intensity by a factor 2 was observed. The origin of the blue emission could be attributed to defect centers of oxygen deficiency in the wires.
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