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Synchrotron Radiation Induced Optical Luminescence from Porous Silicon: Recent Observations

Published online by Cambridge University Press:  15 February 2011

I. Coulthard
Affiliation:
University of Western Ontario, London, Canada, N6A 5B7, icoul@julian.uwo.ca
T. K. Sham
Affiliation:
University of Western Ontario, London, Canada, N6A 5B7, icoul@julian.uwo.ca
D.-T. Jiang
Affiliation:
University of Western Ontario, London, Canada, N6A 5B7, icoul@julian.uwo.ca
K. H. Tan
Affiliation:
C.S.R.F.,Synchrotron Radiation Centre, University of Wisconsin-Madison, Stoughton, WI.
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Abstract

Photoluminescence from porous silicon was examined using synchrotron radiation as an excitation source. The tunability of the excitation source permitted a wide range of excitation energies ranging from VUV to X-rays. This permitted site selective excitation where specific core levels (i.e. Si-K, O-K, Si-2p) were probed. In high porosity samples, luminescence bands of both surface and bulk origins were observed. All experiments exhibited a common luminescence maximum typically in the orange-red region of the visible spectrum. At certain specific excitation energies particularly in the VUV region additional peaks related to sites with oxygen character were also observed. The VUV excitation luminescence spectra of the porous silicon remarkably resembled that of oxygen deficient amorphous silicon dioxide glasses.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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