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Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy

  • D. T. L. Van Agterveld (a1), G. Palasantzas (a1) and J.Th.M. De Hosson (a1)

Abstract

Ultra-high-vacuum segregation studies on in-situ fractured Cu-Sb alloys were performed in terms of nanometer scale scanning Auger/Electron microscopy. S contamination leads to the formation of Cu2S precipitates which, upon removal due to fracture, expose pits with morphology that depends on the precipitate size and shape. Local variations of S and Sb distributions inside the pits were correlated to local surface orientations as Atomic Force Microscopy analysis revealed.

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