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Surface Photovoltage Spectroscopy of InGaN/GaN/AlGaN Multiple Quantum Well Light Emitting Diodes

  • B. Mishori (a1), Martin Muñoz, L. Mourokh (a1), Fred H. Pollak (a1), J.P. DeBray (a2), S. Ting (a2) and I. Ferguson (a2)...

Abstract

InGaN/GaN/AlGaN multiple quantum well light emitting diodes (MWQ LED's) with different levels of p-doping in the contact layer have been characterized using surface photovoltage spectroscopy (SPS). Due to the high sensitivity of the SPS technique to the electric field, there is a strong correlation between the p-doping level in the contact layer and the magnitude of the SPS signal originating from the MQW region. The experimental results are confirmed by a numerical simulation.

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1 Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Kiyoku, H., and Sugimoto, Y., Jpn. J. Appl. Phys. 35, L74 (1996).
2 Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Sugimoto, Y. and Kiyoku, H., Appl. Phys. Lett. 69, 4056 (1996).
3 Akasaki, I., Sota, S., Sakai, H., Tanaka, T., Koike, M., and Amano, H., Electron. Lett. 32, 1105 (1996).
4 Nakamura, S., Senoh, M., Iwasa, N., Nagahama, S., Yamada, T., and Mujai, T., Jpn. J. Appl. Phys. 34, L1332 (1995).
5 Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Kiyoku, H., and Sugimoto, Y., Jpn. J. Appl. Phys. 35, L74 (1996).
6 Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Sugimoto, Y. and Kiyoku, H., Appl. Phys. Lett. 69, 4056 (1996).
7 Akasaki, I., Sota, S., Sakai, H., Tanaka, T., Koike, M., and Amano, H., Electron. Lett. 32, 1105 (1996).
8 Khan, M. Asif, Olson, D. T., and Kuznia, J. N., Carlos, W. I., Freitas, J. A. Jr, J. Appl. Phys. 74, 5901 (1993).
9 Fischer, S., Wetzel, C., , E, , E, , Haller, Meyer, B. K., Appl. Phys. Lett. 67, 1298 (1995).
10. Chichibu, S., Azuhata, T., Sota, T., Nakamura, S., Appl. Phys. Lett. 69, 4188, (1996).
11 Narukawa, Y., Kawakami, Y., Funato, M., Fujita, S., Fujita, S., Nakamura, S., Appl. Phys. Lett. 70, 981 (1997).
12 Shalish, I., Kronik, L., Segal, G., Rosenwaks, Y., Shapira, Y., Tisch, U., and Salzman, J., Phys. Rev. B, 59, 9748 (1999).
13 Shalish, I., Kronik, L., Segal, G., and Shapira, Y., Zamir, S., Meyler, B., and Salzman, J., Phys. Rev. B, 23, 15573 (2000).
14 Krystek, W., Pollak, F. H., Feng, Z.C., Schurman, M. and Stall, R.A., Mat. Res. Soc. Symp. Proc. 482, 573 (1998).
15 Kronik, L. and Shapira, Y., Surface Science Reports 37, 1 (1999).
16 Suzuki, M., Uenoyama, T., Yanase, A., Phys. Rev. B, 52, 8132 (1995)
17 Burstein, L., Bregman, J., and Shapira, Y., J. Appl. Phys., 69, 2312 (1991).
18 Pollak, F.H., Mishori, B., and Muñoz, M., private communication.
19 Nakamura, S., Harada, Y., and Seno, M., Appl. Phys. Lett. 58, 2021 (1991).
20 Yoshida, S., Gonda, S., and Misawa, S., J. Appl. Phys. 53, 6844 (1982).
21 Hacke, P., Detchprohm, T.,. Hiramatsu, K., Sawaki, N., Tadatomo, K., and Miyake, K., J. Appl. Phys. 76, 304 (1994).
22 Ashkinazi, G., Leibovitch, M., and Nathan, M., IEEE Trans. Electron Devices 40, 285 (1993).

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