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Surface Microstructure and Magnetic Properties of Laser-Processed Granular Co-Ag Films

Published online by Cambridge University Press:  10 February 2011

E. Agostinelli
Affiliation:
ICMAT-CNR, Area della Ricerca, 00016 Monterotondo Scalo, ITALY, agostine@mlib.cnr.it
D. Fiorani
Affiliation:
ICMAT-CNR, Area della Ricerca, 00016 Monterotondo Scalo, ITALY, agostine@mlib.cnr.it
S. Foglia
Affiliation:
ICMAT-CNR, Area della Ricerca, 00016 Monterotondo Scalo, ITALY, agostine@mlib.cnr.it
S. Kaciulis
Affiliation:
ICMAT-CNR, Area della Ricerca, 00016 Monterotondo Scalo, ITALY, agostine@mlib.cnr.it
A. M. Testa
Affiliation:
ICMAT-CNR, Area della Ricerca, 00016 Monterotondo Scalo, ITALY, agostine@mlib.cnr.it
M. Vittori-Antisari
Affiliation:
ENEA,INN-NUMA, Roma, ITALY
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Abstract

Co-Ag films prepared by Pulsed Laser Deposition and showing GMR in the as deposited state, have been irradiated by excimer laser: the chemical and structural modification induced by such treatment have been studied by XPS and by atomic force and electron microscopies. The pulsed laser irradiation favors the nucleation of nanosized Co grains at Ag grain boundaries, resulting in an enhancement of the magnetoresistivity at low fields and low temperature. Indeed, after laser treatment, a doubled field sensitivity (δGMR/δH) at T=I0K, with respect to the untreated samples, has been observed. The correlation with the observed magnetic properties variations, is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1. Berkowitz, A.E., Mitchell, J.R., Carey, M. J., Young, A. P., Zhang, S., Spada, F. E., Parker, F. T., Hutten, A. and Thomas, G., Phys. Rev. Lett. 68, 3745 (1992).Google Scholar
2. Xiao, J. Q., Jiang, J. S. and Chien, C. L., Phys. Rev. Lett. 68, 3749 (1992). J. Q. Xiao, J. S. Jiang and C. L.Chien, Phys. Rev. B 46, 9266 (1992).Google Scholar
3. Luby, S., Spasova, M., Majkova, E., Jergel, M., Senderak, R., D'Anna, E., Luches, A., Martino, M., Brunel, M., Zubarev, E. N., Thin Solid Films 311, 15 (1997)Google Scholar
4. Kaciulis, S., Mattogno, G., Treideris, G., Viticoli, S., J. Electron Spectrosc. Relat. Phenom. 70 (1994) 145.Google Scholar
5. Rubinstein, M., Harris, V. G., Das, B. N. and Koon, N. C., Phys. Rev.B 50, 12550 (1994)Google Scholar