Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-06-30T11:00:44.557Z Has data issue: false hasContentIssue false
  • English
  • Français

Superconducting Superlattice Structures

Published online by Cambridge University Press:  25 February 2011

John L. Makous ,
John A. Leavitt ,
Laurence C. Mcintyre Jr. ,
Luigi Maritato ,
Ruggero Vaglio ,
Annamaria Cucolo  and
Charles M. Falco
John L. Makous
Affiliation:
Department of Physics and Optical Sciences Center, University of Arizona, Tucson, Arizona 85721
John A. Leavitt
Affiliation:
Department of Physics and Optical Sciences Center, University of Arizona, Tucson, Arizona 85721
Laurence C. Mcintyre Jr.
Affiliation:
Department of Physics and Optical Sciences Center, University of Arizona, Tucson, Arizona 85721
Luigi Maritato
Affiliation:
INFN-LNF, Via E. Fermi 40, 00044 Frascati, Italy
Ruggero Vaglio
Affiliation:
Dipartimento di Fisica, Universitá di Salerno, 84100 Salerno, Italy
Annamaria Cucolo
Affiliation:
Dipartimento di Fisica, Universitá di Salerno, 84100 Salerno, Italy
Charles M. Falco
Affiliation:
Department of Physics and Optical Sciences Center, University of Arizona, Tucson, Arizona 85721
Get access

Abstract

Superlattice superconductors exhibit behavior different from other “homogeneous” superconductors because of their layered structures. Sputtering has proved to be an excellent technique for producing such multilayered systems. Also, systems naturally having layered structures, such as the new high-Tc materials, can be fabricated by sputtering. Here we describe the preparation of superconducting superlattices by dc triode sputtering and techniques useful for characterizing them. In particular, we discuss Mo/Ta superconducting superlattices and high Tc thin films of YBa2Cu3O7-x.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 103 , 1987 , 287
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Ruggiero, T. W.Barbee, , and Beasley, M. R., Phys. Rev. Lett. 45, 1299 (1980).Google Scholar
2.Vaglio, R., Cucolo, A. M., and Falco, C. M., Phys. Lett. A 118, 89 (1986).Google Scholar
3.Banerjee, I., Yang, Q. S., Falco, C. M., and Schuller, I. K., Solid State Commun. 41, 805 (1982).Google Scholar
4.Falco, C. M. and Schuller, I. K., in Superconductivity in d- and f- Band Metals, edited by Buckel, W. and Weber, W. (Kernforschungszentrum, Karlsruhe, 1982), p. 283.Google Scholar
5.Banerjee, I. and Schuller, I. K., J. Low Temp. Phys. 54, 501 (1981).Google Scholar
6. See, for example, Falco, C. M. and Schuller, I. K., in Synthetic Modulated Structures, edited by Chang, L. L. and Giessen, B. C. (Academic, New York, 1985), Chap. 9.Google Scholar
7. See, for example, Gurvitch, M. and Fiory, A. T., Appl. Phys. Lett. 51,1027 (1987), or M. Hong, S. H. Liou, J. Kwo, and B. A. Davidson, Appl. Phys. Lett. 51, 694 (1987).Google Scholar
8.Falco, C. M., J. Phys. Colloq. 45, C5–499 (1984).Google Scholar
9.Bennett, W. R., PhD, dissertation, University of Arizona, 1985.Google Scholar
10.McIntyre, L. C. Jr, Ashbaugh, M. D., and Leavitt, J. A., to appear in MRS Symposia Proceedings - Materials Modification and Growth Using Ion Beams - Symposium C, 1987 Spring Meeting.Google Scholar
11.Schuller, I. K., Phys. Rev. Lett. 44, 1597 (1980).Google Scholar
12.Klug, H. P. and Alexander, L. E., in X-Ray Diffraction Procedures, 2nd ed. (Wiley, New York, 1974), chap. 9.Google Scholar
13.Werner, T. R., Banerjee, I., Yang, Q. S., Falco, C. M., and Schuller, I. K., Phys. Rev. B 26, 2224 (1982).Google Scholar
14.Khan, M. R., Chun, C. S. L., Felcher, G. P., Grimsditch, M., Kueny, A., Falco, C. M., and Schuller, I. K., Phys. Rev. B 27, 7186 (1983).Google Scholar
15.Gallagher, P. K., O'Bryan, H. M., Sunshine, S. A., and Murphy, D. W., Mater. Res. Bull. 22, 995 (1987).Google Scholar
16.Jorgensen, J. D., Beno, M. A., Hinks, D. G., Soderholm, L., Volin, K. J., Hitterman, R. L., Grace, J. D., Schuller, I. K., Segre, C. U., Zhang, K., and Kleefisch, M. S., Phys. Rev. B 36, 3608 (1987).Google Scholar
17.de Gennes, P. G. and Guyon, E., Phys. Lett. 3, 168 (1963).Google Scholar
18.Hauser, J. J., Theuerer, H. T., and Werthamer, N. R., Phys. Rev. 136, A637(1964).Google Scholar
19.Anderson, P. W., Muttalib, K. A., and Ramakrishnan, T. V., Phys. Rev. B 28, 117 (1983).Google Scholar
20.Camerlingo, C., Scardi, P., Tosello, C., and Vaglio, R., Phys. Rev. 31, 3121 (1984).Google Scholar