Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-21T20:24:30.215Z Has data issue: false hasContentIssue false

Superconducting High TC Thin Films Prepared by Laser Deposition: Comparison of Laser Sources

Published online by Cambridge University Press:  28 February 2011

L. Lynds
Affiliation:
United Technologies Research Center, E. Hartford, CT 06108
B. R. Weinberger
Affiliation:
United Technologies Research Center, E. Hartford, CT 06108
M. P. Lindsay
Affiliation:
United Technologies Research Center, E. Hartford, CT 06108
D. M. Potrepka
Affiliation:
United Technologies Research Center, E. Hartford, CT 06108
Get access

Abstract

A comparison of the energetics and stoichiometry of effluents from YBa2CU307‐x targets ablated by Nd:YAG (1064 nm) and excimer (248 nm) lasers is presented. NdrYAG ablative processes are characterized by specularly directed neutral atom/cluster formation with translational energies in the range of 2 ‐ 20 eV. In sharp contrast, excimer ablation leads mainly to highly forward directed atomic ions with centroid energies between 200 and 400 eV. Analysis of the energetics indicates that different mechanisms are at play but both processes are non‐equilibrium in nature.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Cheung, J. T. and Sankur, H., CRC Critical Review (Solid State Material Science) 15, 109 (1988).Google Scholar
2 Lynds, L., Weinberger, B. R., Potrepka, D. M., Peterson, G.G. and Lindsay, M. P., Physica C 159, 61 (1989).Google Scholar
3 Lynds, L., Weinberger, B. R., Peterson, G.G. and Krasinski, H. A., Appl. Phys. Lett. 52, 320 (1988).Google Scholar
4 Inam, A., Hegde, M. S., Wu, X. D., Venkatesan, T., England, P., Miceli, P. F., Chase, E. W., Chang, C. C., Tarascon, J. M. and Wachtman, J. B. Appl. Phys Lett. 53, 908 (1988); references therein.Google Scholar