Skip to main content Accessibility help
×
Home

A Study of the Interface Between THM Grown MCT Crystals and Cdte Seeds.

  • I. Shilo (a1), E. Kedar (a1) and D. Szafranek (a2)

Abstract

HgCdTe crystals have been grown from CdTe seeds by the travelling heater method (THM). Three different kinds of interfaces between the growing crystal and the seed were found: a sharp planar interface; a non-planar interface which is caused by meltback near the ampoule walls; a diffuse zone, where an interface cannot be discerned. A correlation was found between the initial growth parameters and the interface structure. Microprobe analysis revealed a boundary layer which, in the case of the planar interface, had an unusual shape. This layer had a thickness varying from 400 to 800 microns. It consisted mostly of HgTe, and contained holes as defects.

Copyright

References

Hide All
1. Triboulet, R., Duy, T. Nguyen, and Durand, A., J. Vac. Sci. Technol. A3(1), (1985).
2. Colombo, L., Chang, R.R., Chang, C.J., and Baird, B.A., J. Vac. Sci Technol. A6(4), 2795 (1988).
3. Kim, Do Hyun and Brown, R.A., J. Cryst. Growth 96, 609 (1989).
4. Holland, L. R., J. Cryst. Growth 96, 577 (1989).
5. Huang, Y., Debnam, W.J. and Fripp, A.L., J. Cryst. Growth 104, 315 (1990).
6. Szofran, F.R. and Lehoczky, S.L., J. Cryst. Growth 70, 349 (1984).
7. Yip, V.F.S., Chang, C.E. and Wilcox, W.R., J. Cryst. Growth 29, 69 (1975).
8. Chang, J., Baird, B., Liao, Pok-Kai, Chang, R. and Colombo, L., J. cryst. Growth 98, 595 (1989).
9. Capper, P., Gosney, J.J.G., Jones, C.L. and Quelch, M.J.T., J. Cryst. Growth 63, 154 (1983).

A Study of the Interface Between THM Grown MCT Crystals and Cdte Seeds.

  • I. Shilo (a1), E. Kedar (a1) and D. Szafranek (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed