Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-18T03:13:12.035Z Has data issue: false hasContentIssue false
  • English
  • Français

A Study of Increased Resistivity of FTO Back Contact for CZTS Based Absorber Material Grown by Electrodeposition-Annealing Route

Published online by Cambridge University Press:  23 May 2011

Prashant K. Sarswat ,
Michael L. Free  and
Ashutosh Tiwari
Prashant K. Sarswat
Affiliation:
Metallurgical Engineering, University of Utah, Salt Lake City, UT, United States.
Michael L. Free
Affiliation:
Metallurgical Engineering, University of Utah, Salt Lake City, UT, United States.
Ashutosh Tiwari
Affiliation:
Materials science and engineering, University of Utah, Salt Lake City, UT, United States.
Get access

Abstract

CZTS (Copper zinc tin sulfide) thin films have been synthesized on transparent conducting oxide (TCO) back contacts on a glass substrate, allowing sun light to pass through the entire solar cell. Aqueous solution based co-electrodeposition followed by elevated temperature sulfurization, was used to grow CZTS on transparent fluorinated tin oxide. Loss in conductivity of FTO is observed after sulfurization, causing reduced device efficiency. Increased resistivity of the FTO is likely due to outdiffusion process. A systematic study of resistivity of back contact at various sulfurization temperatures and times is discussed. Various remedial measures for improved conductivity of back contact were proposed and conducted.

Keywords

transparent conductorphotovoltaicelectrodeposition
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1315: Symposium MM – Transparent Conducting Oxides and Applications , 2011 , mrsf10-1315-mm07-05
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Katagiri, H., Sasaguchi, N., Hando, S., Hoshino, S., Ohashi, J., Yokota, T., Sol. Energ. Mater. Sol. C. 49, 407 (1997).Google Scholar
2. Fernandese, P. A., Salomé, P. M. P., da Cunha, A. F., Thin Solid Films 517, 2519 (2009).Google Scholar
3. Nakada, T., Hirabayashi, Y., Tokado, T., Ohmori, D., Proceedings of the Third World Conference on Photovaltaic Energy Conversion, vols a–c, 2003, pp. 2880–2883.Google Scholar
4. Zaouk, D., Zaatar, Y., Khoury, A., Llinares, C., Charles, J.P., Bechara, J. et Ajaka, M., 2000 Mediterranean Conference for Environment and Solar (2000) 96.Google Scholar
5. Proscia, J., Gordon, R. G., Thin Solid Films 214, 175 (1992).Google Scholar
6. Shrotriya, V. and Li, G., U.S. Patent no. 20090229667 (17 September. 2009)Google Scholar
7. Chandra, H., George, M. A., Madocks, J., Photovoltaic Specialists Conference (PVSC), (2009) 34th IEEE, pp 001519–001522 Google Scholar
8. Nakada, T., Thin Solid Films 480–481, (2005).Google Scholar
9. Smits, F.M., Measurement of sheet resistivities with four-point probe, Bell Syst. Tech. J. 37 (1958), pp. 711–718.Google Scholar
10. Elangovan, E., Ramamurthi, K., Applied surface science 249 (1–4), (2005) 183.Google Scholar