Skip to main content Accessibility help
×
Home

Study of grain growth and defect formation in Ag thin films by planar TEM with in-situ heating

  • S. Brossard (a1), F. Martin (a1) and J. Bourgon (a2)

Abstract

Silver thin films are used as a functional layer in many applications such as low-emissivity and solar control coatings on glass for insulating windows, as well as transparent conducting electrodes for OLEDs and PV. For these applications, the conductivity of the film is critical; it is linked to the crystallinity and the grain size of silver layers which thickness ranges from 5 to 15nm. Such coatings often undergo thermal treatments up to 700°C aimed at toughening the glass substrate or improving the coating itself by promoting grain growth and curing point defects. This treatment can however dramatically damage the silver layer by inducing the formation of defects in the layer, such as holes or silver domes, decreasing both conductivity and light transmission of the coatings. Because of the extreme thinness of the films (less than 15 nm), the investigation of these phenomena requires in situ imaging at the nanoscale. In this study, grain growth and defects formation were observed in 15 nm-thick Ag films encapsulated with zinc oxide and silicon nitride using Transmission Electron Microscopy with in-situ heating from ambient temperature to 600°C. Significant grain growth was found to occur only from 400°C, and from 500°C holes in the silver layer started to form and grow, as well as thick silver domes formed by dewetting. Irradiation by the electron beam was also found to cause grain growth.

Copyright

References

Hide All
1. Sun, T., Yao, B., Warren, A. P., Barmak, K., Toney, M. F., Peale, R. E., and Coffey, K. R., Physical Review B 81, 155454 (2010).
2. Dannenberg, R., Stach, E., Groza, J. R., and Dresser, B. J., Thin Solid Films 379, 133 (2000).
3. Yao, B., Sun, T., Kumar, V., Barmak, K., and Coffey, K. R., Journal of Materials Research 23, 2033 (2011).
4. Choi, D., Wang, B., Chung, S., Liu, X., Darbal, A., Wise, A., Nuhfer, N. T., Barmak, K., Warren, A. P., Coffey, K. R., and Toney, M. F., Journal of Vacuum Science & Technology A 29, 051512 (2011).
5. Rupert, T. J., Gianola, D. S., Gan, Y., and Hemker, K. J., Science 326, 1686 (2009).
6. Gianola, D. S., Van Petegem, S., Legros, M., Brandstetter, S., Van Swygenhoven, H., and Hemker, K. J., Acta Materialia 54, 2253 (2006).
7. Kobler, A., Kashiwar, A., Hahn, H., and Kübel, C., Ultramicroscopy 128, 68 (2013).
8. Kobler, A., Lohmiller, J., Schäfer, J., Kerber, M., Castrup, A., Kashiwar, A., Gruber, P. a, Albe, K., Hahn, H., and Kübel, C., Beilstein Journal of Nanotechnology 4, 554 (2013).
9. Lin, Z. and Bristowe, P. D., Journal of Applied Physics 102, 103513 (2007).
10. Jedrecy, N., Renaud, G., Lazzari, R., and Jupille, J., Physical Review B 72, 195404 (2005).
11. Arbab, M., Thin Solid Films 381, 1521 (2001).
12. Sahu, D., Chen, C., Lin, S. and Huang, J., Thin Solid Films 515, 932 (2006).
13. Kim, S. J., Stach, E. and Handwerker, C., Thin Solid Films 520, 6189 (2012).

Keywords

Study of grain growth and defect formation in Ag thin films by planar TEM with in-situ heating

  • S. Brossard (a1), F. Martin (a1) and J. Bourgon (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed