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Structure Imaging and Defects in Crystallized Oxynitride Glasses

  • R.S. Rai, M.A. O'Keefe (a1) and G. Thomas (a1)

Abstract

High resolution electron microscopy has been employed to elucidate fault defects and structural details of the δ1 and δ2 -Y 2Si2O7 crystalline phases. From this study δ1 and δ2 -Y 2Si2O7 have been found to be orthorhombic having the same cell parameters but different atomic arrangements due to a change in their space groups. Computer simulations were necessary for interpreting details from the high resolution electron micrographs.

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Structure Imaging and Defects in Crystallized Oxynitride Glasses

  • R.S. Rai, M.A. O'Keefe (a1) and G. Thomas (a1)

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