Skip to main content Accessibility help
×
Home

Structure Determination of the Nisi2(111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

  • J. Vrijmoeth (a1), P.M. Zagwijn (a1), J.W.M. Frenken (a1) and J.F. van der Veen (a1)

Abstract

The surface structure of epitaxial NiSi2 films grown on Si (111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the NiSi2 (111) surface are resolved.

The topology of the NiSi2 (111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.

Copyright

References

Hide All
1. Yang, W.S., Jona, F., and Marcus, P.M., Phys. Rev. B28, 7377 (1983).
2. van Loenen, E.J., Fischer, A.E.M.J., van der Veen, J.F., and Legoues, F., Surface Science 154, 52 (1985).
3. Porter, T.L., Cornelison, D.M., Chang, C.S., and Tsong, I.S.T., J. Vac. Sci. Technol. A5, 2497 (1990).
4. Vrijmoeth, J., Schins, A.G., and van der Veen, J.F., Phys. Rev. B40, 3121 (1989).
5. Tung, R.T., J. Vac. Sci. Technol. A5, 1840 (1987).
6. Andersen, H.H., and Ziegler, J.F., The Stopping and Ranges of Ions in Matter (Pergamon, New York, 1977).
7. Vrijmoeth, J. et al., to be published.

Structure Determination of the Nisi2(111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

  • J. Vrijmoeth (a1), P.M. Zagwijn (a1), J.W.M. Frenken (a1) and J.F. van der Veen (a1)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed