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Structure and Magnetic Properties of Epitaxial NiFe2O4 Films

  • R. B. van Dover (a1), S. Venzke (a1), E. M. Gyorgy (a1), T. Siegrist (a1), J. M. Phillips (a1), J. H. Marshall (a1) and R. J. Felder (a1)...

Abstract

We have made NiFe2O4 films by rf sputtering using the 90 °off-axis geometry. Films grown at 600°C on SrTiO3 and Y.15Zr.85O2 substrates are single crystals with (100) and (110) texture, respectively, but exhibit a very large and unexpected random anisotropy. A postdeposition air anneal at ˜1000°C has little effect on the crystallinity of the films but almost completely eliminates the random anisotropy; the remaining anisotropy is consistent with expected (bulk) values. A decrease of the saturation magnetization, indicating degradation, was observed for films on SrTiO3 (but not Y.15Zr.85O2) annealed at 1300°C.

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1. Williams, C. M., et al., J. Appl Phys. 75, 1676 (1994).
2. Phillips, J. M., Dover, R. B. van, Gyorgy, E. M., and Marshall, J. H., Proc. Mat. Res. Soc., (Fall 1993 Meeting).
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  • EISSN: 1946-4274
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