Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-23T09:32:16.593Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural Study of CIGS2 Thin Film Absorbers using EBSD Technique

Published online by Cambridge University Press:  20 June 2011

Ashwani Kaul ,
Shirish A. Pethe ,
Neelkanth G. Dhere  and
Helio R. Moutinho
Ashwani Kaul
Affiliation:
Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, FL 32922, U.S.A.
Shirish A. Pethe
Affiliation:
Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, FL 32922, U.S.A.
Neelkanth G. Dhere
Affiliation:
Florida Solar Energy Center, 1679 Clearlake Road, Cocoa, FL 32922, U.S.A.
Helio R. Moutinho
Affiliation:
National Renewable Energy Laboratory, Golden, CO, U.S.A.
Get access

Abstract

In this study electron backscatter diffraction (EBSD) investigation is carried out for CuIn1-xGaXS2 (CIGS2) samples that were prepared by two stage process in which the initial precursor was deposited by DC magnetron sputtering followed by sulfurization in conventional furnace. Due to high surface roughness, low quality EBSD signal was obtained in the samples that were initially polished with ion milling. Polishing with dimpler grinder followed by chemical treatment with bromine/methanol solution improved the quality of EBSD patterns. Efforts are being made to build the database for CIGS2 in the system using high quality EBSD patterns and finally to obtain grain orientation maps.

Keywords

thin filmsputteringphotovoltaic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1323: Symposium C – Advanced Materials Processing for Scalable Solar-Cell Manufacturing , 2011 , mrss11-1323-c03-44
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Dingley, D.J. and Randle, V., J. Mater. Sci. 27, 4545 (1992).Google Scholar
2. Dingley, D.J. and Field, D.P., Mater. Sci. Technol. 13, 69 (1997).Google Scholar
3. Baba-Kishi, K.Z. and Dingley, D.J., Scanning 11, 305 (1989).Google Scholar
4. Schwartz, Adam J., Kumar, Mukul and Adams, Brent L., “Electron Backscatter Diffraction in Material Science", Springer Publications, 2000. “From Google Books”.Google Scholar
5. Dhere, N. G., and Kadam, A. A., U.S. Patent CuIn1−xGaxSe2−ySy (CIGSS) thin film solar cells prepared by selenization /sulfurization in a conventional furnace using a new precursor, U.S. Patent 7632701.Google Scholar
6. Jahagirdar, A. H., Kadam, A. A., and Dhere, N. G., “Role of i-ZnO in Optimizing Open Circuit Voltage of CIGS2 and CIGS Thin Film Solar Cells” Proc. 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, Waikoloa, Hawaii, Volume 2, May 2006, pp. 2199 – 2201.Google Scholar
7. Kadam, A. A., Dhere, N. G, “Highly efficient CuIn1−xGaxSe2−ySy/CdS thin-film solar cells by using diethylselenide as selenium precursor, Solar Energy Materials & Solar Cells”, vol. 94, pp. 738–743, (2010).Google Scholar
8. Wolf, Dieter, and Yip, Sidney, “Materials Interfaces: Atomic-level Structure and Properties”, Springer Publications, 1992. “From Google Book”. Smith, M., and Miller, A., Proceedings 17th European Photovoltaic Solar Energy Conference, Vol. I (2002) 903.Google Scholar